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Vijñāna Parishad of India

Jñānābha‎, Vol. 55 SI (I) (2025), (34-40)

BURR X DISTRIBUTION REPRESENT TO ACCELERATED LIFE TEST WITH SAMPLING PLAN


By

S.Gandhiya Vendhan and K.Chitraleka

Department of Statistics, Bharathiar University, Tamil Nadu, India-641046

Email: gandhiyavendhan@yahoo.com, chitraleka2011@gmail.com

(Received: January 08, 2023; Informat: February 24,2024; Revised: June 02, 2025; Accepted: July 04, 2025)


DOI: https://doi.org/10.58250/jnanabha_SI.2025.55105


Abstract

This papers study on truncated life tests takes a look at while the lifetime follows the Burr X distribution represented in a recognition sampling plan. Accelerated lifestyles check is at the moment the focal manner of measuring invention reliability rapidly, and the layout of efficient take a look at tactics is important to ensure that ALTs can determine the product dependability and sensitivity analyses are executed to evaluate the make certain an impact on which the improbability inside the assumed AF brings at the threats. This examines the development of the idea and approach for the improvement of the most fulfilling ALT for the region and scale distribution, that’s the furthermost purposeful and innovative shape of designing the most fulfilling ALT plan. A running function value represented within the sampling plans with associated threats is mentioned in the tables and related values.




2020 Mathematical Sciences Classification: 62C05, 60Exx.

Keywords and Phrases: Sampling Plan, Accelerate Life test, Producer risk, Consumer risk, Burr X Distribution.


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